Dr. Jong-Ahn Kim
at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (16)

SPIE Journal Paper | 27 May 2022 Open Access
Jae Heun Woo, Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Sunghoon Eom, Jae Yong Lee
OE, Vol. 61, Issue 05, 054104, (May 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.5.054104
KEYWORDS: 3D metrology, Prisms, 3D scanning, 3D acquisition, Laser scanners, Clouds, Scanners, Distortion, Optical engineering, 3D-TOF imaging

Proceedings Article | 5 June 2013 Paper
Proceedings Volume 8706, 87060W (2013) https://doi.org/10.1117/12.2014800
KEYWORDS: Semiconducting wafers, Silicon, Refractive index, Wafer-level optics, Geometrical optics, Fourier transforms, Light sources, Pulsed laser operation, Spectroscopy, Femtosecond phenomena

Proceedings Article | 5 June 2013 Paper
Proceedings Volume 8706, 87060V (2013) https://doi.org/10.1117/12.2014799
KEYWORDS: Refractive index, Semiconducting wafers, Silicon, Pulsed laser operation, Femtosecond phenomena, Wafer-level optics, Phase measurement, Reliability, Semiconductor lasers, Light sources

Proceedings Article | 13 May 2013 Paper
Proceedings Volume 8788, 87883P (2013) https://doi.org/10.1117/12.2020470
KEYWORDS: Computer programming, Calibration, Imaging systems, Optical microscopes, Digital cameras, CCD cameras, Tablets, Interferometers, Aluminum, Distance measurement

Proceedings Article | 14 May 2012 Paper
Proceedings Volume 8379, 83791A (2012) https://doi.org/10.1117/12.920522
KEYWORDS: LIDAR, Signal detection, Avalanche photodetectors, Avalanche photodiodes, Sensors, Distance measurement, Light sources, Photodiodes, Time metrology, Standards development

Showing 5 of 16 publications
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