Jonas Bartsch
at Bremer Institut für ange­wandte Strahl­technik GmbH
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 June 2021 Poster + Presentation + Paper
Proceedings Volume 11787, 117870H (2021) https://doi.org/10.1117/12.2592296

Proceedings Article | 20 June 2021 Poster + Presentation + Paper
Proceedings Volume 11787, 117870G (2021) https://doi.org/10.1117/12.2592295
KEYWORDS: Calibration, Cameras, Stereoscopic cameras, LCDs, Imaging systems, Visual process modeling, 3D metrology, Refraction, Ray tracing, Projection systems

Proceedings Article | 3 September 2019 Paper
Shekhar Kumar Patra, Jonas Bartsch, Michael Kalms, Ralf Bergmann
Proceedings Volume 11102, 111020Q (2019) https://doi.org/10.1117/12.2527894
KEYWORDS: Phase measurement, Cameras, Manufacturing, Deflectometry, Diamond turning, Reflection, Surface finishing, Surface properties, Scattering, Imaging systems

Proceedings Article | 4 September 2018 Presentation + Paper
Proceedings Volume 10750, 107500I (2018) https://doi.org/10.1117/12.2319366
KEYWORDS: Calibration, Cameras, Visual process modeling, Imaging systems, Optical calibration, Metrology, Optical metrology, CCD cameras, Precision calibration

Proceedings Article | 24 May 2018 Presentation + Paper
Proceedings Volume 10678, 106780Y (2018) https://doi.org/10.1117/12.2306463
KEYWORDS: Cameras, Device simulation, Calibration, Deflectometry, Phase measurement, Model-based design, Visual process modeling, Reflection, Refraction, Displays

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top