Prof. John F. Federici Profile

Prof. John F. Federici

Professor of Physics at New Jersey Institute of Technology

SPIE Involvement:

Author

Publications (27)

Proceedings Article | 18 December 2019 Paper

Propagation studies for indoor and outdoor terahertz wireless links

Jianjun Ma, Yu Mei, Rabi Shrestha, Lothar Moeller, John Federici, Daniel Mittleman

Proceedings Volume 11334, 113341I (2019) https://doi.org/10.1117/12.2542501

KEYWORDS: Terahertz radiation, Signal attenuation, Non-line-of-sight propagation, Turbulence, Diodes, Reflection, Modulation, Scattering, Atmospheric propagation, Receivers

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Proceedings Article | 2 May 2017 Presentation + Paper

Non-destructive evaluation of specialty coating degradation using terahertz time-domain spectroscopy

Carley Nicoletti, Laura Cramer, Alan Fletcher, David Zimdars, Zafar Iqbal, John Federici

Proceedings Volume 10206, 102060W (2017) https://doi.org/10.1117/12.2258027

KEYWORDS: Nondestructive evaluation, Reflectance spectroscopy, Terahertz radiation, Spectroscopy, Ultraviolet radiation, Humidity, Testing and analysis, Refractive index, Data analysis, Coating, Multilayers, Reflectivity, Scanning electron microscopy

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The Terahertz Time Domain Reflection Spectroscopy (THz-TDS) method of paint layer diagnostics is a non-contact electromagnetic technique analogous to pulsed-ultrasound with the added capability of spectroscopic characterization. The THz-TDS sensor emits a near-single cycle electromagnetic pulse with a bandwidth from 0.1 to 3 THz. This wide bandwidth pulse is focused on the coating, and echo pulses are generated from each interface (air-coating, layer-layer, coating-substrate). In this paper, the THz-TDS method is applied to specialty aircraft coatings. The THz-TDS method is able to penetrate the whole coating stack and sample the properties of each layer. Because the reflected pulses from individual layers typically overlap in time, the complex permittivity function and thickness of each layer is determined by a best fit of the measured reflection (either in time or frequency domain) to a layered model of the paint. The THz- TDS method is applied to specialty coatings prior to and during accelerated aging on a series of test coupons. The coupons are also examined during aging using ATR (attenuated total reflectance)-FTIR spectroscopy, Raman scattering spectroscopy, and Scanning Electron Microscopy (SEM) to ascertain, quantify, and understand the breakdown mechanisms of the coatings. In addition, the same samples are characterized using THz-TDS techniques to determine if the THz-TDS method can be utilized as a non-destructive evaluation technique to sense degradation of the coatings. Our results suggest that the degradation mechanism begins in the top coat layer. In this layer, 254 nm UV illumination in combination with the presence of moisture works partially with oxides as catalysts to decompose the polymer matrix thereby creating porosity in the top coat layer. Since the catalytic effect is partial, loss of the oxides by chemical reaction can also occur. As the topcoat layer becomes more porous, it allows water vapor to permeate the topcoat layer and interact with the rain erosion layer via carbonization of the polymer matrix in the rain erosion layer. The presence of the salt accelerates the pitting degradation. The goal of this paper is to determine if THz-TDS can be used to sense degradation of the coating.

Proceedings Article | 18 February 2008 Paper

Microfabricated implantable pressure sensor for flow measurement

Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas

Proceedings Volume 6884, 68840I (2008) https://doi.org/10.1117/12.763740

KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Silicon films, Reactive ion etching, Etching, Silica

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Proceedings Article | 12 February 2008 Paper

Microfabricated implantable flow sensor for medical applications

Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas

Proceedings Volume 6886, 688606 (2008) https://doi.org/10.1117/12.763795

KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Finite element methods, Optical lithography, Photomasks, Silica

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Proceedings Article | 4 May 2007 Paper

Terahertz interferometric imaging of RDX

Alexander Sinyukov, Robert Barat, Dale Gary, Zoi-Heleni Michalopoulou, Ivan Zorych, David Zimdars, John Federici

Proceedings Volume 6549, 654909 (2007) https://doi.org/10.1117/12.719234

KEYWORDS: Terahertz radiation, Interferometry, Sensors, Detector arrays, Spherical lenses, Absorption, Image resolution, Weapons, Explosives, Imaging systems

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Proceedings Article | 19 January 2007 Paper

Cyclic thin film flexible pressure sensor testing

Hee Lim, James Zunino, John Federici

Proceedings Volume 6463, 64630A (2007) https://doi.org/10.1117/12.704223

KEYWORDS: Sensors, Thin films, Oscilloscopes, Power supplies, Relays, Data acquisition, LabVIEW, Electronic circuits, Physics, Nitrogen

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Proceedings Article | 12 October 2006 Paper

Terahertz interferometric imaging of a concealed object

Alexander Sinyukov, Aparajita Bandyopadhyay, Amartya Sengupta, Robert Barat, Dale Gary, Zoi-Heleni Michalopoulou, David Zimdars, John Federici

Proceedings Volume 6373, 63730K (2006) https://doi.org/10.1117/12.685139

KEYWORDS: Terahertz radiation, Interferometry, Sensors, Detector arrays, Imaging systems, Spatial resolution, Metals, Explosives, Weapons, Absorption

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Proceedings Article | 19 May 2006 Paper

Terahertz interferometric and synthetic aperture imaging

Alexander Sinyukov, Aparajita Bandyopadhyay, Amartya Sengupta, Robert Barat, Dale Gary, Zoi-Heleni Michalopoulou, David Zimdars, John Federici

Proceedings Volume 6212, 62120Z (2006) https://doi.org/10.1117/12.664690

KEYWORDS: Terahertz radiation, Sensors, Interferometry, Metals, Detector arrays, Spatial resolution, Imaging systems, Explosives, Atmospheric propagation, Phase shifts

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Proceedings Article | 7 March 2006 Paper

Grain size dependent scattering studies of common materials using THz time domain techniques

Aparajita Bandyopadhyay, Amartya Sengupta, Robert Barat, Dale Gary, John Federici

Proceedings Volume 6120, 61200H (2006) https://doi.org/10.1117/12.647868

KEYWORDS: Terahertz radiation, Mie scattering, Scattering, Refractive index, Absorption, Solids, Spherical lenses, Spectroscopy, Rayleigh scattering, Antennas

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Proceedings Article | 7 March 2006 Paper

THz reflection spectroscopy of C-4 explosive and its detection through interferometric imaging

Amartya Sengupta, Aparajita Bandyopadhyay, Robert Barat, Dale Gary, John Federici

Proceedings Volume 6120, 61200A (2006) https://doi.org/10.1117/12.641727

KEYWORDS: Terahertz radiation, Interferometry, Spectroscopy, Sensors, Imaging spectroscopy, Reflectance spectroscopy, Explosives, Gold, Reflectivity, Imaging systems

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Proceedings Article | 7 March 2006 Paper

Characterization of hollow polycarbonate metal waveguides using Terahertz time domain spectroscopy

Aparajita Bandyopadhyay, Amartya Sengupta, Valencia Johnson, James Harrington, John Federici

Proceedings Volume 6120, 61200B (2006) https://doi.org/10.1117/12.642972

KEYWORDS: Waveguides, Terahertz radiation, Dispersion, Signal attenuation, Copper, Wave propagation, Atmospheric propagation, Metals, Terahertz spectroscopy, Spectroscopy

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Proceedings Article | 19 May 2005 Paper

THz standoff detection and imaging of explosives and weapons

John Federici, Dale Gary, Robert Barat, David Zimdars

Proceedings Volume 5781, (2005) https://doi.org/10.1117/12.604695

KEYWORDS: Terahertz radiation, Explosives, Sensors, Interferometry, Weapons, Signal attenuation, Absorption, Atmospheric propagation, Imaging arrays, Standoff detection

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Proceedings Article | 18 May 2005 Paper

Terahertz imaging using an interferometric array

John Federici, Dale Gary, Robert Barat, David Zimdars

Proceedings Volume 5790, (2005) https://doi.org/10.1117/12.603864

KEYWORDS: Terahertz radiation, Sensors, Interferometry, Phase measurement, Imaging arrays, Explosives, Imaging systems, Receivers, Weapons, Wavefronts

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Proceedings Article | 25 March 2005 Paper

THz standoff detection and imaging of explosives and weapons

John Federici, Robert Barat, Dale Gary, David Zimdars

Proceedings Volume 5727, (2005) https://doi.org/10.1117/12.590377

KEYWORDS: Terahertz radiation, Sensors, Interferometry, Imaging arrays, Explosives, Imaging systems, Weapons, Near field, Wavefronts, Staring arrays

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Proceedings Article | 17 March 2005 Paper

Biological material imaging using THz-echo analysis method

Feng Huang, John Federici, Robert Barat, Dale Gary

Proceedings Volume 5580, (2005) https://doi.org/10.1117/12.584191

KEYWORDS: Terahertz radiation, Absorption, Spectroscopy, Signal detection, Biological research, Scattering, Refraction, Imaging spectroscopy, Light scattering, Ultrafast imaging

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Proceedings Article | 21 February 2005 Paper

Physical imaging of void using ultrafast light in optical precision

Feng Huang, John Federici, Dale Gary

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.583393

KEYWORDS: Terahertz radiation, Ultrafast imaging, Refraction, Signal detection, Precision optics, Apodization, Signal to noise ratio, Optical coherence tomography, Spectroscopy, Optical testing

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Proceedings Article | 16 December 2004 Paper

Transfer function study of biological samples by the THz-TDS

Feng Huang, John Federici, Robert Barat, Dale Gary, David Zimdars

Proceedings Volume 5585, (2004) https://doi.org/10.1117/12.567681

KEYWORDS: Terahertz radiation, Spectroscopy, Biological research, Signal to noise ratio, Signal detection, Proteins, Statistical analysis, Apodization, Silicon, Interference (communication)

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Proceedings Article | 14 December 2004 Paper

Detection of the agent inside or behind a barrier material

Feng Huang, John Federici, Robert Barat, Dale Gary

Proceedings Volume 5584, (2004) https://doi.org/10.1117/12.580183

KEYWORDS: Terahertz radiation, Absorption, Spectroscopy, Transmittance, Explosives, Terahertz spectroscopy, Refraction, Reflection, Refractive index, Statistical analysis

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Proceedings Article | 14 December 2004 Paper

Optical properties around resonance peaks by THz-TDS

Feng Huang, John Federici, Robert Barat, Dale Gary, David Zimdars

Proceedings Volume 5584, (2004) https://doi.org/10.1117/12.567687

KEYWORDS: Terahertz radiation, Absorption, Spectroscopy, Optical properties, Explosives, Transmittance, Phonons, Reflectivity, Refractive index, Oscillators

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Proceedings Article | 8 September 2004 Paper

Terahertz near-field interferometric and synthetic aperture imaging

Kenneth Walsh, Brian Schulkin, Dale Gary, John Federici, Robert Barat, David Zimdars

Proceedings Volume 5411, (2004) https://doi.org/10.1117/12.541525

KEYWORDS: Sensors, Spherical lenses, Wavefronts, Near field, Imaging arrays, Interferometry, Terahertz radiation, Signal to noise ratio, Synthetic aperture imaging, Explosives

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Proceedings Article | 8 September 2004 Paper

Analysis of terahertz spectral images of explosives and bioagents using trained neural networks

Filipe Oliveira, Robert Barat, Brian Schulkin, Feng Huang, John Federici, Dale Gary, David Zimdars

Proceedings Volume 5411, (2004) https://doi.org/10.1117/12.542648

KEYWORDS: Terahertz radiation, Neural networks, Interferometry, Explosives, Sensors, Artificial neural networks, Neurons, LabVIEW, Biological research, Tolerancing

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Proceedings Article | 27 February 2004 Paper

Characteristics of nanoscale composites by THz spectroscopy

Hakan Altan, Feng Huang, John Federici, Aidong Lan, Haim Grebel

Proceedings Volume 5268, (2004) https://doi.org/10.1117/12.519503

KEYWORDS: Terahertz radiation, Quartz, Silicon, Visible radiation, Spectroscopy, Dielectrics, Picosecond phenomena, Data modeling, Absorption, Semiconductors

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Proceedings Article | 29 July 2003 Paper

Characteristics of nanoscale composites by terahertz spectroscopy

Hakan Altan, Feng Huang, John Federici, Aidong Lan, Haim Grebel

Proceedings Volume 5070, (2003) https://doi.org/10.1117/12.506898

KEYWORDS: Terahertz radiation, Quartz, Silicon, Visible radiation, Spectroscopy, Picosecond phenomena, Absorption, Composites, Silica, Ions

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Proceedings Article | 29 July 2003 Paper

Neural network analysis of terahertz spectra of explosives and bio-agents

Felipe Oliveira, Robert Barat, Brian Shulkin, John Federici, Dale Gary, David Zimdars

Proceedings Volume 5070, (2003) https://doi.org/10.1117/12.500875

KEYWORDS: Terahertz radiation, Neural networks, Metals, Explosives, Analytical research, Biological research, Matrices, Detector arrays, Imaging arrays, Reflectivity

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SPIE Journal Paper | 1 January 2003 Open Access

Measurement of skin stretch via light reflection

Nejat Guzelsu, John Federici, Hee Lim, Hans Chauhdry, Arthur Ritter, Tom Findley

JBO, Vol. 8, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1527936

KEYWORDS: Skin, Reflectivity, Polarization, Tissue optics, Tissues, In vivo imaging, Reflection, Natural surfaces, Light scattering, Scattering

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Proceedings Article | 10 June 1996 Paper

Defect mechanism of photoinduced superconductivity in YBa2Cu3Ox

Denise Chew, John Federici, J. Gutierrez-Solana, G. Molina, William Savin, W. Wilber

Proceedings Volume 2696, (1996) https://doi.org/10.1117/12.241780

KEYWORDS: Oxygen, Resistance, Luminescence, Quenching (fluorescence), Electrons, Infrared radiation, Superconductivity, Superconductors, Liquids, Switching

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Proceedings Article | 23 March 1993 Paper

Spectral dependence of noise and gain in Er-doped fiber preamplifier at 980 nm

Jean-Marc Delavaux, John Federici, David DiGiovanni

Proceedings Volume 1789, (1993) https://doi.org/10.1117/12.141142

KEYWORDS: Optical amplifiers, Interference (communication), Fiber amplifiers, Erbium, Fiber lasers, Data modeling, Wave propagation, Semiconductor lasers, Fiber couplers, Multiplexers

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Showing 5 of 27 publications

Conference Committee Involvement (3)

Disruptive Technologies in Sensors and Sensor Systems

11 April 2017 | Anaheim, CA, United States

Terahertz Physics, Devices, and Systems II

11 September 2007 | Boston, MA, United States

Terahertz Physics, Devices, and Systems

2 October 2006 | Boston, Massachusetts, United States

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