Prof. Johel Miteran Profile

Prof. Johel Miteran

at Univ de Bourgogne

SPIE Involvement:

Author

Publications (17)

Proceedings Article | 8 October 2018 Presentation + Paper

Comparative study of deep learning and classical methods: smart camera implementation for face authentication

Pierre Bonazza, Johel Miteran, Dominique Ginhac, Julien Dubois

Proceedings Volume 10802, 108020I (2018) https://doi.org/10.1117/12.2325697

KEYWORDS: Principal component analysis, Image filtering, Image processing, Machine learning, Biometrics, Cameras, Facial recognition systems, Data compression, Convolutional neural networks

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Proceedings Article | 24 May 2018 Paper

Image quality enhancement based on real-time deconvolution and super resolution

Yoan Marin, Abdelali Douiyek, Johel Mitéran, Julien Dubois, Barthélémy Heyrman, Dominique Ginhac

Proceedings Volume 10677, 106772P (2018) https://doi.org/10.1117/12.2306437

KEYWORDS: Image processing, Deconvolution, Point spread functions, Image quality, Super resolution, Image enhancement, Image resolution, Field programmable gate arrays, Visualization, Cameras

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SPIE Journal Paper | 22 July 2013

Optimized spatio-temporal descriptors for real-time fall detection: comparison of support vector machine and Adaboost-based classification

Imen Charfi, Johel Miteran, Julien Dubois, Mohamed Atri, Rached Tourki

JEI, Vol. 22, Issue 04, 041106, (July 2013) https://doi.org/10.1117/12.10.1117/1.JEI.22.4.041106

KEYWORDS: Video, Cameras, Feature extraction, Feature selection, Video surveillance, Actinium, Image classification, Fourier transforms, Wavelet transforms, Classification systems

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Proceedings Article | 29 May 2007 Paper

A hardware architecture for fast video object recognition using SVM and Zernike moments

Cedric Lemaitre, Johel Miteran, Olivier Aubreton, Romuald Mosqueron

Proceedings Volume 6356, 63560X (2007) https://doi.org/10.1117/12.736745

KEYWORDS: Object recognition, Binary data, Field programmable gate arrays, Video, Databases, Feature extraction, Pattern recognition, Double patterning technology, Machine vision, Classification systems

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SPIE Journal Paper | 1 January 2006

Real-time flaw detection on a complex object: comparison of results using classification with a support vector machine, boosting, and hyperrectangle-based method

Johel Miteran, S. Bouillant, Michel Paindavoine, Fabrice Meriaudeau, Julien Dubois

JEI, Vol. 15, Issue 01, 013018, (January 2006) https://doi.org/10.1117/12.10.1117/1.2179436

KEYWORDS: Manufacturing, Feature extraction, Machine vision, Feature selection, Inspection, Image segmentation, Scene classification, Neural networks, Image processing, Classification systems

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SPIE Journal Paper | 1 March 2005

Merging system for multiscale edge detection

Olivier Laligant, Frederic Truchetet, Johel Miteran, Patrick Gorria

OE, Vol. 44, Issue 03, 035602, (March 2005) https://doi.org/10.1117/12.10.1117/1.1869998

KEYWORDS: Image segmentation, Edge detection, Image filtering, Optical engineering, Sensors, Digital filtering, Image processing, Neodymium, Image quality, Electronic filtering

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Proceedings Article | 3 May 2004 Paper

Real-time flaw detection on complex part: classification with SVM and Hyperrectangle-based method

Sebastien Bouillant, Johel Miteran, Michel Paindavoine, Fabrice Meriaudeau

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.530838

KEYWORDS: Feature extraction, Machine vision, Manufacturing, Inspection, Scene classification, Feature selection, Classification systems, Image processing, Statistical modeling, Light emitting diodes

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Proceedings Article | 1 May 2003 Paper

Real-time image segmentation for anomaly detection using SVM

S. Bouillant, Johel Miteran, Michel Paindavoine, El-Bay Bourennane, P. Bourgeat

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.515163

KEYWORDS: Image segmentation, Image processing algorithms and systems, Field programmable gate arrays, Image classification, Neural networks, Algorithm development, Image quality, Manufacturing, Reconfigurable computing, Detection and tracking algorithms

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Proceedings Article | 13 April 2001 Paper

Face modeling: a real-time embedded implementation of a stereovision algorithm

Jean-Philippe Zimmer, Johel Miteran

Proceedings Volume 4298, (2001) https://doi.org/10.1117/12.424901

KEYWORDS: Digital signal processing, Image processing, Logic, Cameras, 3D image processing, Field programmable gate arrays, Detection and tracking algorithms, Data processing, Calibration, Computer architecture

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Proceedings Article | 4 April 2001 Paper

New filter for detecting defects on industrial parts by artificial vision

Sophie Kohler, Pierre Geveaux, Johel Miteran

Proceedings Volume 4301, (2001) https://doi.org/10.1117/12.420899

KEYWORDS: Electronic filtering, Defect detection, Signal to noise ratio, Image segmentation, Signal detection, Light sources and illumination, Machine vision, Gaussian filters, Digital filtering, Bandpass filters

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SPIE Journal Paper | 1 April 2001

Access control: adaptation and real-time implantation of a face recognition method

Johel Miteran, Jean-Philippe Zimmer, Fan Yang, Michel Paindavoine

OE, Vol. 40, Issue 04, (April 2001) https://doi.org/10.1117/12.10.1117/1.1355256

KEYWORDS: Facial recognition systems, Light sources and illumination, Neural networks, Databases, Cameras, Optical engineering, Adaptive control, Detection and tracking algorithms, Image processing, Edge detection

SPIE Journal Paper | 1 December 2000

Analysis of compatibility between lighting devices and descriptive features using Parzen's Kernel: application to flaw inspection by artifical vision

Pierre Geveaux, Sophie Kohler, Johel Miteran, Frederic Truchetet

OE, Vol. 39, Issue 12, (December 2000) https://doi.org/10.1117/12.10.1117/1.1323676

KEYWORDS: Light sources and illumination, Chromium, Inspection, Machine vision, Feature selection, Error analysis, Optical engineering, Statistical analysis, Principal component analysis, Image processing

SPIE Journal Paper | 1 November 2000

New image filtering technique combining a wavelet transform with a linear neural network: application to face recognition

Fan Yang, Michel Paindavoine, Herve Abdi, Johel Miteran

OE, Vol. 39, Issue 11, (November 2000) https://doi.org/10.1117/12.10.1117/1.1308492

KEYWORDS: Image filtering, Performance modeling, Wavelets, Wavelet transforms, Filtering (signal processing), Neural networks, Electronic filtering, Facial recognition systems, Interference (communication), Cognitive modeling

Proceedings Article | 21 March 2000 Paper

Comparison between two classification methods: application to defects detection by artificial vision in industrial field

Pierre Geveaux, Sophie Kohler, Johel Miteran, Frederic Truchetet, Fabrice Meriaudeau

Proceedings Volume 3966, (2000) https://doi.org/10.1117/12.380069

KEYWORDS: Machine vision, Image segmentation, Defect detection, Image classification, Light sources and illumination, Statistical analysis, Electroluminescence, Pattern recognition, Image quality, Classification systems

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Quality control by artificial vision is getting more and more widespread within the industry. Indeed, in many cases, industrial applications require a control with high stability performance, satisfying high production rate. For texture control, some major problems may occur: uneasiness to show different textures, segmentation features as well as classification and decision phases requiring still to much computation time. This article presents a comparison between two non-parametric classification methods used for real time control of textured objects moving at a cadence of 10 pieces per second. Four types of flaws have to be indifferently detected: smooth surfaces, bumps, hollow knocked surfaces and lacks of material. These defects generate texture variations which have to be detected and sorted out by our system, each flaw apparition being registered to carry out a survey over the production cycle. We previously presented a search for an optimal lighting system, in this case the acquired images were tremendously improved. On these optimal images, we described a method for selecting the best segmentation features. The third step, which is presented here, is a comparison between two multi-classes classification algorithms: the Parzen's estimator and the so-called 'stressed polytopes' method. These two algorithms which require a learning phase are both based on a non-parametric discrimination method of the flaw classes. In one hand, they are both relatively inexpensive in time calculation but on the other hand they present different assets relative to the easiness of the learning phase or the number of useable segmentation features. They also have a different behavior towards the cut out of the features space, especially on the 'cross-classes' border. Their comparison is made through the aforementioned quoted points which are relevant for the evaluation of the discrimination efficiency. Finally, through an industrial example we present the results of such a comparison. The control, a PC based machine, includes the calculation five classification features (calculations were carried out on the local neighborhood of each pixel), five distinct classes for the classification phase and the decision phase. This led to a 3,63% classification error ratio for the best compromise.

Proceedings Article | 8 March 1999 Paper

Method of searching segmentation parameters applied to quality control of industrial pieces

Pierre Geveaux, Sophie Kohler, Johel Miteran, Frederic Truchetet

Proceedings Volume 3652, (1999) https://doi.org/10.1117/12.341127

KEYWORDS: Light sources and illumination, Image segmentation, Machine vision, Defect detection, Image quality, Feature extraction, Feature selection, Principal component analysis, Inspection, Nanoimprint lithography

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Proceedings Article | 6 October 1998 Paper

Searching method for an optimal lighting application for defect detection by artificial vision in industrial field

Pierre Geveaux, Sophie Kohler, Johel Miteran, Frederic Truchetet

Proceedings Volume 3522, (1998) https://doi.org/10.1117/12.325755

KEYWORDS: Light sources and illumination, Machine vision, Defect detection, Image quality, Light emitting diodes, Image segmentation, Robots, Computer vision technology, Robot vision, Active vision

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Proceedings Article | 11 October 1994 Paper

Frame of wavelets for edge detection

Frederic Truchetet, Olivier Laligant, E. Bourenanne, Johel Miteran

Proceedings Volume 2303, (1994) https://doi.org/10.1117/12.188766

KEYWORDS: Edge detection, Wavelets, Image segmentation, Image filtering, Digital filtering, Electronic filtering, Signal to noise ratio, Detection and tracking algorithms, Linear filtering, Optimization (mathematics)

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Showing 5 of 17 publications

Conference Committee Involvement (1)

Machine Vision Applications in Industrial Inspection XII

21 January 2004 | San Jose, California, United States

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