Johannes Köpnick
at Philips Medical Systems DMC GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 April 2023 Presentation + Paper
Proceedings Volume 12464, 1246409 (2023) https://doi.org/10.1117/12.2651757
KEYWORDS: Visibility, X-rays, Education and training, Image quality, X-ray imaging, X-ray detectors, Convolutional neural networks, Diagnostics, Design and modelling, Radiography, Beam guidance systems

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