Jimmy Zaid
at Univ of New Hampshire
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 22 August 2024 Presentation
Proceedings Volume 13093, 130932K (2024) https://doi.org/10.1117/12.3020647

Proceedings Article | 22 August 2024 Presentation
Jessica Gaskin, Mark McConnell, Randy Baggett, Matthew Baring, Peter Bloser, Byron Bonds, Dennis Bowler, Michael Briggs, Camden Ertley, Paul Galloway, Adam Goldstein, J. Eric Grove, Dieter Hartmann, Peter Jenke, R. Marc Kippen, Fabian Kislat, Daniel Kocevski, Merlin Kole, John Krizmanic, Jason Legere, Tyson Littenberg, Neil Martin, Sheila McBreen, Chip Meegan, Karla Oñate Melecio, Mark Pearce, John Polizotti, Rob Preece, Nicolas Produit, James Ryan, Felix Ryde, Lisa Smith, Steven Sturner, Vincent Tatischeff, Peter Veres, W. Thomas Vestrand, Colleen Wilson-Hodge, George Younes, Jimmy Zaid, Bing Zhang
Proceedings Volume 13093, 130932C (2024) https://doi.org/10.1117/12.3020072

Proceedings Article | 19 July 2024 Poster
Proceedings Volume 13096, 130963N (2024) https://doi.org/10.1117/12.3020811
KEYWORDS: Equipment, Polarimetry, Gamma radiation, Design, Calibration, Scintillators, Spectroscopes, Sensors, Polarization, Optical arrays

Proceedings Article | 4 October 2022 Presentation + Paper
Karla Oñate Melecio, Christopher Bancroft, Camden Ertley, Fabian Kislat, Jason Legere, Steve Longworth, Mark McConnell, Kevin Mello, Dominic Puopolo, Jimmy Zaid, James Ryan
Proceedings Volume 12241, 122410G (2022) https://doi.org/10.1117/12.2632817
KEYWORDS: Polarization, Polarimetry, Scintillators, Gamma radiation, Spatial resolution, Photon polarization, Sensors, Compton scattering, Scattering, Physics

Proceedings Article | 31 August 2022 Presentation + Paper
Karla Oñate Melecio, Christopher Bancroft, Camden Ertley, Fabian Kislat, Jason Legere, Steve Longworth, Mark McConnell, James Ryan, Jimmy Zaid
Proceedings Volume 12181, 121812N (2022) https://doi.org/10.1117/12.2629044
KEYWORDS: Gamma ray imaging, Scintillators, Prototyping, Sensors, Polarization, Gamma radiation, Polarimetry, Calibration, Compton scattering, Data acquisition, Device simulation

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