Jeremy A. Walraven
Senior Member Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 5 February 2010 Paper
Danelle Tanner, Roy Olsson, Ted Parson, Shannon Crouch, Jeremy Walraven, James Ohlhausen
Proceedings Volume 7592, 759209 (2010) https://doi.org/10.1117/12.846551
KEYWORDS: Resonators, Semiconducting wafers, Aluminum nitride, Silicon, Microelectromechanical systems, Electrodes, Contamination, Aluminum, Network security, Sensors

Proceedings Article | 22 January 2005 Paper
Leslie Phinney, Kelly Klody, John Sackos, Jeremy Walraven
Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.594408
KEYWORDS: Actuators, Oxides, Microelectromechanical systems, Laser induced damage, Thermography, Optical fabrication, Laser irradiation, Silicon, Failure analysis, Target detection

Proceedings Article | 22 January 2005 Paper
Jeremy Walraven, Edward Cole, David Barr, Richard Anderson, Alice Kilgo, John Maciel, Richard Morrison, Nafiz Karabudak
Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.600794
KEYWORDS: Failure analysis, Microelectromechanical systems, Inspection, Silicon, Polishing, Epoxies, Electrical breakdown, Ceramics, Switches, Packaging

Proceedings Article | 23 December 2003 Paper
Richard Plass, Michael Baker, Jeremy Walraven
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.530936
KEYWORDS: Actuators, Thermal modeling, Reliability, Scanning electron microscopy, Silicon, Resistance, Photomicroscopy, Microelectromechanical systems, Modulation, Data modeling

Proceedings Article | 16 January 2003 Paper
Jeremy Walraven, Bernhard Jokiel
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.478207
KEYWORDS: Failure analysis, Actuators, Oxides, Tolerancing, Computer aided design, Microfabrication, Reliability, Silicon, Microelectromechanical systems, Optical alignment

Showing 5 of 11 publications
Conference Committee Involvement (4)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
25 January 2006 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
25 January 2005 | San Jose, California, United States
Reliability, Testing, and Characterization of MEMS/MOEMS III
26 January 2004 | San Jose, California, United States
Reliability, Testing, and Characterization of MEMS/MOEMS II
27 January 2003 | San Jose, CA, United States
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