Dr. Jan Garrevoet Profile

Dr. Jan Garrevoet

at Deutsches Elektronen-Synchrotron

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 6 October 2023 Presentation

Multibeam x-ray ptychography: Using partial coherence to speed-up high-resolution imaging

Mikhail Lyubomirskiy, Tang Li, Maik Kahnt, Felix Wittwer, Martin Seyrich, Adam Kubec, Ken Falch, Jan Garrevoet, Christian David, Christian Schroer

Proceedings Volume PC12698, PC1269805 (2023) https://doi.org/10.1117/12.2675485

KEYWORDS: X-rays, X-ray imaging, Partial coherence, Signal detection, Optics manufacturing, Lithographic illumination, Lens arrays, Image restoration, Additive manufacturing, Time metrology

Read Abstract +

Proceedings Article | 4 October 2022 Presentation + Paper

Hard x-ray wavefront engineering for aberration correction and beam shaping

Christian Schroer, Frank Seiboth, Andreas Schropp, Silvio Achilles, Martin Seyrich, Svenja Patjens, Micheal Stuckelberger, Jan Garrevoet, Vanessa Galbierz, Gerald Falkenberg, Adam Kubec, Christian David, Sven Niese, Peter Gawlitza

Proceedings Volume 12240, 122400J (2022) https://doi.org/10.1117/12.2633458

KEYWORDS: Wave propagation, Wavefronts, X-rays, Beam shaping, Beam propagation method, X-ray optics, Aberration correction, Phase shifts, Synchrotron radiation

Read Abstract +

Proceedings Article | 9 September 2019 Presentation + Paper

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

Christian Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg

Proceedings Volume 11112, 111120D (2019) https://doi.org/10.1117/12.2529096

KEYWORDS: Sensors, Microscopes, Signal detection, Laser scattering, Scanners, Nitrogen

Read Abstract +

Proceedings Article | 9 September 2019 Presentation + Paper

Full-field hard X-ray microscopy based on aberration-corrected Be CRLs

Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, Christian Schroer

Proceedings Volume 11112, 1111208 (2019) https://doi.org/10.1117/12.2528422

KEYWORDS: Beryllium, X-rays, X-ray microscopy, Microscopy, X-ray optics, Tomography, Hard x-rays, Spatial resolution, Lenses

Read Abstract +

Proceedings Article | 7 September 2017 Paper

PtyNAMi: ptychographic nano-analytical microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

Christian Schroer, Martin Seyrich, Maik Kahnt, Stephan Botta, Ralph Döhrmann, Gerald Falkenberg, Jan Garrevoet, Mikhail Lyubomirskiy, Maria Scholz, Andreas Schropp, Felix Wittwer

Proceedings Volume 10389, 103890E (2017) https://doi.org/10.1117/12.2273710

KEYWORDS: X-rays, Microscopes, Sensors, X-ray microscopy, X-ray optics, Laser scattering, Scattering, X-ray diffraction, X-ray imaging, Tomography

Read Abstract +

Proceedings Article | 23 August 2017 Paper

Aberration correction for hard x-ray focusing at the nanoscale

Frank Seiboth, Andreas Schropp, Maria Scholz, Felix Wittwer, Christian Rödel, Martin Wünsche, Tobias Ullsperger, Stefan Nolte, Jussi Rahomäki, Karolis Parfeniukas, Stylianos Giakoumidis, Ulrich Vogt, Ulrich Wagner, Christoph Rau, Ulrike Boesenberg, Jan Garrevoet, Gerald Falkenberg, Eric Galtier, Hae Ja Lee, Bob Nagler, Christian Schroer

Proceedings Volume 10386, 103860A (2017) https://doi.org/10.1117/12.2274030

KEYWORDS: X-ray optics, X-rays, X-ray diffraction, Synchrotron radiation, Reflectivity, X-ray characterization, Glasses, Optical testing, Aberration correction, Femtosecond phenomena, Wavefront reconstruction, Wavefront aberrations, Wavefront analysis, Wavefront compensation

Read Abstract +

Proceedings Article | 15 September 2016 Paper

Quantitative characterization of aberrations in x-ray optics

Frank Seiboth, Maik Kahnt, Maria Scholz, Martin Seyrich, Felix Wittwer, Jan Garrevoet, Gerald Falkenberg, Andreas Schropp, Christian Schroer

Proceedings Volume 9963, 99630P (2016) https://doi.org/10.1117/12.2237646

KEYWORDS: X-ray optics, Optics manufacturing, X-rays, Beryllium, Wavefronts, Zernike polynomials, Electroluminescent displays, Monochromatic aberrations, Spherical lenses, Visible radiation

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years