James L. Zunino
Factor IV Materials Engineer at US Army CCDC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 31 March 2010 Paper
James Zunino, Zafar Iqbal
Proceedings Volume 7646, 76461K (2010) https://doi.org/10.1117/12.847654
KEYWORDS: Polymers, Personal digital assistants, Zinc oxide, Temperature metrology, Densitometry, Zirconium dioxide, Optical coatings, Colorimetry, Microscopes, Digital photography

Proceedings Article | 19 February 2008 Paper
James Zunino, Donald Skelton, Charles Robinson
Proceedings Volume 6884, 68840C (2008) https://doi.org/10.1117/12.765221
KEYWORDS: Microelectromechanical systems, Reliability, Failure analysis, Instrument modeling, Humidity, Standards development, Weapons, Visualization, Data modeling, Safety

Proceedings Article | 18 February 2008 Paper
Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas
Proceedings Volume 6884, 68840I (2008) https://doi.org/10.1117/12.763740
KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Silicon films, Reactive ion etching, Etching, Silica

Proceedings Article | 18 February 2008 Paper
James Zunino, Donald Skelton, Ryan Marinis, Adam Klempner, Peter Hefti, Ryszard Pryputniewicz
Proceedings Volume 6884, 688407 (2008) https://doi.org/10.1117/12.759659
KEYWORDS: Microelectromechanical systems, Nondestructive evaluation, Optoelectronics, Fringe analysis, Reliability, Finite element methods, Switches, Fused deposition modeling, CCD cameras, Microscopes

Proceedings Article | 12 February 2008 Paper
Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas
Proceedings Volume 6886, 688606 (2008) https://doi.org/10.1117/12.763795
KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Finite element methods, Optical lithography, Photomasks, Silica

Showing 5 of 12 publications
Proceedings Volume Editor (2)

Conference Committee Involvement (4)
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
28 January 2009 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
21 January 2008 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
23 January 2007 | San Jose, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
25 January 2006 | San Jose, California, United States
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