Dr. Huddee J. Ho Profile

Dr. Huddee J. Ho

at FortéBio Corp

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Author

Publications (2)

Proceedings Article | 1 September 1998 Paper

Near-contact mode: a novel AFM operation mode for nondestructive ultrahigh lateral-resolution topography measurement in air

Huddee Ho

Proceedings Volume 3512, (1998) https://doi.org/10.1117/12.324048

KEYWORDS: Contamination, Atomic force microscopy, Capillaries, Image resolution, Molecules, Coating, Nondestructive evaluation, Feedback signals, Energy transfer, Glasses

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Proceedings Article | 7 July 1997 Paper

Dimensional metrology at the nanometer level: combined SEM and PPM

Michael Postek, Huddee Ho, Harrison Weese

Proceedings Volume 3050, (1997) https://doi.org/10.1117/12.275914

KEYWORDS: Scanning electron microscopy, Standards development, Atomic force microscopy, Scanning tunneling microscopy, Metrology, Dimensional metrology, Microscopes, Photomicroscopy, Electron microscopes, Microscopy

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