Dr. Horst Hammer
at Fraunhofer IOSB
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 19 October 2023 Presentation + Paper
Silvia Kuny, Horst Hammer, Antje Thiele
Proceedings Volume 12734, 127340E (2023) https://doi.org/10.1117/12.2688241
KEYWORDS: Synthetic aperture radar, Image segmentation, Detection and tracking algorithms, Convolutional neural networks

Proceedings Article | 20 September 2020 Presentation + Paper
M. Evers, A. Kyriou, A. Thiele, H. Hammer, K. Nikolakopoulos, K. Schulz
Proceedings Volume 11534, 115340L (2020) https://doi.org/10.1117/12.2573880
KEYWORDS: Global Positioning System, Satellite navigation systems, Interferometric synthetic aperture radar, Statistical analysis, Structural engineering, Floods, Synthetic aperture radar, Temporal resolution, Statistical modeling

Proceedings Article | 7 October 2019 Paper
Horst Hammer, Antje Thiele, Fabian Lorenz, Erich Cadario, Silvia Kuny, Karsten Schulz
Proceedings Volume 11155, 1115511 (2019) https://doi.org/10.1117/12.2533147
KEYWORDS: Coherence (optics), Statistical analysis, Interferometric synthetic aperture radar, Interferometry, Image quality, Synthetic aperture radar, Sensors, Optical sensors, Image processing, Phase interferometry

Proceedings Article | 9 October 2018 Paper
Horst Hammer, Klaus Hoffmann, Karsten Schulz
Proceedings Volume 10789, 107890P (2018) https://doi.org/10.1117/12.2324719
KEYWORDS: Synthetic aperture radar, Device simulation, 3D modeling, Sensors, Image classification, Radar, Convolutional neural networks, Automatic target recognition, Image processing, Computer simulations

Proceedings Article | 5 October 2017 Paper
Amelie Welte, Horst Hammer, Antje Thiele, Stefan Hinz
Proceedings Volume 10428, 1042804 (2017) https://doi.org/10.1117/12.2278408
KEYWORDS: Buildings, Interferometry, Phase interferometry, Image segmentation, Synthetic aperture radar, Interferometric synthetic aperture radar, Image resolution, High resolution satellite images, Satellites, Image analysis

Showing 5 of 12 publications
Conference Committee Involvement (1)
Microwave Remote Sensing: Data Processing and Applications II
6 September 2023 | Amsterdam, Netherlands
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