Mr. Hisatoshi Fujiwara Profile

Hisatoshi Fujiwara

Engineer at Yamatake Corp

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Publications (4)

Proceedings Article | 18 October 2002 Paper

Reflection moiré for high spatial resolution

Hisatoshi Fujiwara, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467398

KEYWORDS: Reflection, Phase shifting, Spatial resolution, Light sources, Image sensors, Moire patterns, Diffraction gratings, Camera shutters, Charge-coupled devices, Spatial frequencies

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Proceedings Article | 4 October 2001 Paper

Flatness measurement by UV moire

Hisatoshi Fujiwara, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 4564, (2001) https://doi.org/10.1117/12.444102

KEYWORDS: Reflection, Glasses, LCDs, Ultraviolet radiation, Error analysis, Phase shifting, Moire patterns, Prototyping, Mirrors, Time metrology

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Proceedings Article | 30 June 1998 Paper

Flatness measurement by a UV moire technique

Hisatoshi Fujiwara, Yutaka Kodera, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312970

KEYWORDS: Glasses, Moire patterns, Phase shifting, LCDs, Ultraviolet radiation, Semiconducting wafers, Time metrology, Phase measurement, Ceramics, Optical components

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Proceedings Article | 4 November 1996 Paper

Flatness measurement by reflection moire technique

Hisatoshi Fujiwara, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 2862, (1996) https://doi.org/10.1117/12.256201

KEYWORDS: Glasses, Moire patterns, LCDs, Phase shifting, Reflection, Lenses, Ultraviolet radiation, Light sources, Silica, Semiconducting wafers

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