Hiroki Fujino
at Yokohama National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 October 2012 Paper
Hiroki Fujino, Takahide Oya
Proceedings Volume 8463, 84631D (2012) https://doi.org/10.1117/12.928922
KEYWORDS: Quantum dots, Stochastic processes, Interference (communication), Electrons, Thermal effects, Capacitance, Tolerancing, Monte Carlo methods, Resistance, Device simulation

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