Hacheme Ayasso
PhD Student at Lab des Signaux et Systèmes
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 February 2011 Paper
Proceedings Volume 7873, 78730U (2011) https://doi.org/10.1117/12.872317
KEYWORDS: Diffraction, Optical tomography, Tomography, Data modeling, Scatter measurement, Inverse scattering problem, Statistical analysis, Phase modulation, Algorithm development, Dielectrics

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