Gerd Rössler
at Svti
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 April 2020 Presentation + Paper
Proceedings Volume 11409, 114090C (2020) https://doi.org/10.1117/12.2556853
KEYWORDS: Inspection, Thermography, Manufacturing, Phase measurement, Nondestructive evaluation, Scanning electron microscopy, Diffusion, Thermal modeling, Statistical analysis, Signal to noise ratio

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top