Mr. Geerten F. I. J. Kramer Profile

Geerten F. I. J. Kramer

at TNO Science and Industry

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Author

Publications (4)

Proceedings Article | 2 March 2020 Paper

Beam multiplexing for satellite communication optical feeder links

Fabrizio Silvestri, Federico Pettazzi, Martin Eschen, Jeroen Boschma, Jochem Lutgerink, Geerten F. I. Kramer, Wim Korevaar, Remco den Breeje, Cristina Duque, Niek Doelman

Proceedings Volume 11272, 1127213 (2020) https://doi.org/10.1117/12.2543035

KEYWORDS: Telescopes, Multiplexing, Multiplexers, Satellite communications, Diffraction gratings, Dense wavelength division multiplexing, Satellites, Diffraction, Modulation

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Proceedings Article | 8 March 2016 Paper

Large dynamic range Atomic Force Microscope for overlay improvements

Stefan Kuiper, Erik Fritz, Will Crowcombe, Thomas Liebig, Geerten Kramer, Gert Witvoet, Tom Duivenvoorde, Ton Overtoom, Ramon Rijnbeek, Erwin van Zwet, Anton van Dijsseldonk, Arie den Boef, Marcel Beems, Leon Levasier

Proceedings Volume 9778, 97781B (2016) https://doi.org/10.1117/12.2218249

KEYWORDS: Metrology, Overlay metrology, Scanning probe microscopy, Optical alignment, Lithography, Atomic force microscopy, Atomic force microscope, Image resolution, Nondestructive evaluation, High dynamic range imaging, Semiconducting wafers, Distance measurement, Semiconductors, Interferometers, Sensors

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Proceedings Article | 2 April 2014 Paper

Parallel, miniaturized scanning probe microscope for defect inspection and review

H. Sadeghian, T. van den Dool, W. Crowcombe, R. Herfst, J. Winters, G. F. I. Kramer, N. Koster

Proceedings Volume 9050, 90501B (2014) https://doi.org/10.1117/12.2045557

KEYWORDS: Scanning probe microscopy, Semiconducting wafers, Head, Inspection, Defect inspection, Scanning probe microscopes, Photomasks, Metrology, Motion measurement, Semiconductors

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Proceedings Article | 22 August 2009 Paper

Nanometer level freeform surface measurements with the NANOMEFOS non-contact measurement machine

Rens Henselmans, Lennino Cacace, Geerten Kramer, Nick Rosielle, Maarten Steinbuch

Proceedings Volume 7426, 742606 (2009) https://doi.org/10.1117/12.826067

KEYWORDS: Metrology, Freeform optics, Spindles, Calibration, Optics manufacturing, Electronics, Motion measurement, Photovoltaics, Control systems, Prototyping

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