In short-distance optical links, the development of driving circuits for vertical-cavity surface-emitting lasers (VCSELs) requires precise and computationally efficient VCSEL models. A small-signal model of a VCSEL is computationally efficient and simple to implement; however, it does not take into account the nonlinear output behavior of the VCSEL. In contrast, VCSEL models that are highly based on first principles cannot be implemented in standard circuit device simulators, because the simulation of eye diagrams becomes too time consuming. We present another approach using VCSEL models, which are based on the 1-D rate equations. Our analysis shows that they combine efficient extraction and short simulation time with an accurate calculation of eye diagrams over a wide range of ambient temperatures. As different implementations of the rate equations exist, tradeoffs between three different versions are presented and compared with measured GaAs oxide-confined VCSELs. The first model has a linear and the second a logarithmic function of the gain versus the carrier density. The third model considers the additional transport time for carriers to reach the active region with quantum wells. For parameter extraction, a minimum set of parameters is identified, which can be determined from fundamental measurements.
In this paper, the noise properties of transistors on 90 nm silicon on insulator (SOI) and bulk CMOS technologies are investigated. At 20 GHz, the SOI and bulk devices have minimum noise figures of 1 dB and 2.3 dB, respectively, demonstrating the superior performance of the SOI technology. The corresponding maximum available gain is 13 dB and 12 dB, respectively. For the first time, the drain and gate noise coefficients of shortchannel SOI devices are extracted yielding values of 2.15 and 1.7, respectively. Theoretical aspects are discussed to identify the main noise sources and to gain insights for optimizations. Furthermore, examples of analog monolithic integrated circuits fabricated on SOI technology are presented. Measured results are a noise figure of 4 dB for a low noise amplifier (LNA) at 40 GHz, a single side band noise figure of 9 dB for a passive mixer at 40 GHz and a phase noise of -90 dBc at 1 MHz offset for an voltage controlled oscillator (VCO) at 60 GHz. To the knowledge of the authors, these are the best noise performances achieved to date for CMOS based transistors and circuits at millimeter wave frequencies.
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