High Energy Physics experiments make extensive use of micro-strip silicon sensors for tracking purposes. However, the high granularity of the modern detectors makes the connection between the segmented sensor channels and the readout electronics very complex. Enhancing the complexity, a direct connection is not possible in most of the cases due to the mismatch between the detector pad pitch and the electronics. A new method based on laser technology is presented for the fabrication of pitch adapters. In this new method the high-density metal traces are manufactured by means of laser ablation of the metal layer deposited on top of a substrate. Glass, Kapton and Silicon substrates were metal coated and tested for the fabrication of pitch adapters. Finally, a metal-on-glass prototype has been successfully manufactured and tested for electrical conductivity, bondability and metrology. Detectors have been assembled using this pitch adapters design and tested in particle beams at CERN.
Metal coatings have been produced using a Pulsed Laser Deposition (PLD) process based on a dynamic
prism system. A nanosecond pulsed Nd:YVO4 laser emitting at a wavelength of 1064 nm is steared
through a couple of prisms into a metallic target placed inside a vacuum chamber. This work presents the
study of the parameters applied to achieve ablation of two metallic targets, aluminum and brass, in order
to obtain their respective metallic coatings on glass substrates by pulsed laser deposition. The results
obtained allow to standardize the optimal laser and set-up parameters in order to obtain homogeneous
layers, tunable thickness and/or semi-transparent mirror behaviour through the formation of an adequate
plasma plume. Microstructure and transmittance spectra of these coatings are also reported.
Planar step-index waveguides of SiO2:TiO2 and ZrO2:CeO2 in multilayer structures were prepared onto commercial glass
substrates using a sol-gel technique combined with dip-coating. These coatings were previously optically characterized
by Ellipsometry. These glassy coatings were structural characterized by Transmission Electron Microscopy (TEM),
Energy Dispersive X-ray analysis and Confocal Microscopy. Thicknesses of 1050 nm and 500 nm and refractive indices
of 1.64 and 2.07 for SiO2:TiO2 (70:30) and ZrO2:CeO2 (70:30) waveguides were obtained, respectively, by the analysis
of the guided TE and TM modes observed by Dark m-line Spectroscopy. Losses of 1.32 dB/cm and 0.86 dB/cm were
respectively measured by a method based on scattered light.
Planar waveguides of SiO2:TiO2 (multilayer structure) and SiO2:CeO2 (thick layer) were prepared onto commercial glass
substrates using a sol-gel technique combined with dip-coating. These glassy coatings were structural characterised by
Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis and by Confocal Microscopy. Thicknesses
of 1230 nm and 4,15 μm and refractive indices of 1.59 and 1.48 for SiO2:TiO2 (70:30) and SiO2:CeO2 (95:5) waveguides
were obtained, respectively, by Spectroscopic Ellypsometry. Losses of 0.8 dB/cm were measured by double prism
method in the SiO2:CeO2 system.
Conference Committee Involvement (11)
IV Congresso Luso-Espanhol de Cerâmica e Vidro
16 November 2011 |
China International Conference on High-Performance Ceramics
4 November 2011 |
22nd General COngress of the International Comission for Optics (ICO-22)
15 August 2011 |
AOP'2011 International Conference on Applications of Optics and Photonics
3 May 2011 |
European Conference on Solid State Chemistry XII
20 September 2009 |
IX Reunión Nacional de Óptica
14 September 2009 |
XLVIII Congreso Anual de la Sociedad Española de Cerámica y Vidrio
29 October 2008 |
V Congreso Franco-Español de Química y Física del Estado Sólido
2 April 2008 |
XLVII Congreso anual de la Sociedad Española de Cerámica y Vidrio
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