Dr. Fei Su Profile

Dr. Fei Su

at Singapore Institute of Manufacturing Technology

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Author

Publications (4)

SPIE Journal Paper | 1 December 2004

Use of Wollaston prism to simplify the polarization method for simultaneous recording of moiré interferometry fringe patterns

Fei Su, Yao Feng Sun, Kerm Chian, Sung Yi, Fulong Dai

OE, Vol. 43, Issue 12, (December 2004) https://doi.org/10.1117/12.10.1117/1.1811082

KEYWORDS: Fringe analysis, Prisms, Polarization, Deflectometry, Beam splitters, Error analysis, Diffraction, Diffraction gratings, Wavefronts, Polarizers

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Proceedings Article | 19 June 2002 Paper

Quantitative investigation of chemical shrinkage stress in flip chip using a 3D moire interferometry system

Fei Su, Lie Liu, Sung Yi, Kerm Chian

Proceedings Volume 4778, (2002) https://doi.org/10.1117/12.473561

KEYWORDS: Fringe analysis, Chemical analysis, Deflectometry, Silicon, Reliability, 3D modeling, Packaging, Finite element methods, Temperature metrology, Thermal modeling

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Proceedings Article | 29 May 2002 Paper

Experimental investigation on the complex thermomechanical behavior of plastic packages

Sung Yi, Fei Su, Fulong Dai, Lie Liu, Vora Mehul

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468761

KEYWORDS: Reliability, Fringe analysis, Moire patterns, Finite element methods, Packaging, Absorption, Microelectronics, Electronics, Materials processing, Polymers

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Proceedings Article | 16 October 2001 Paper

Experimental methods for thermomechanical characterization of electronic packages: a review and evaluation

Fei Su, Sung Yi, Fulong Dai, Huimin Xie, Mehu Vora, Xiaoyuan He

Proceedings Volume 4602, (2001) https://doi.org/10.1117/12.445732

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