Dr. Eric M. Dufresne
Beamline Scientist at Argonne National Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 13 September 2006 Paper
Proceedings Volume 6317, 63170Q (2006) https://doi.org/10.1117/12.684350
KEYWORDS: X-rays, Beryllium, Lenses, Lithium, Absorption, Refraction, Photons, Solids, Tolerancing, X-ray technology

Proceedings Article | 4 November 2004 Paper
Proceedings Volume 5539, (2004) https://doi.org/10.1117/12.583231
KEYWORDS: Lithium, X-rays, X-ray imaging, X-ray optics, Refraction, Diagnostics, Solids, Scattering, Crystals, Charge-coupled devices

Proceedings Article | 3 November 2004 Paper
Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.561399
KEYWORDS: Silicon, X-rays, Reflectivity, Multilayers, Monochromators, Absorption, Interfaces, X-ray diffraction, Sputter deposition, Synchrotron radiation

Proceedings Article | 23 December 2003 Paper
Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.502658
KEYWORDS: Mirrors, Multilayers, Reflectivity, Solids, Silicon, Crystals, Charge-coupled devices, Coating, X-rays, Glasses

Proceedings Article | 6 December 2001 Paper
Nino Pereira, Dohn Arms, Roy Clarke, Steve Dierker, Eric Dufresne, D. Foster
Proceedings Volume 4502, (2001) https://doi.org/10.1117/12.449856
KEYWORDS: Teeth, Lithium, Lenses, Signal attenuation, Absorption, Manufacturing, Metals, Beryllium, X-ray optics, Geometrical optics

Showing 5 of 6 publications
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