It is well known that Spatial Light Modulators (SLM) are of great interest and used in many different areas because of their continuous capability of light modulation and their potential as a linear variable retarder. However, high-definition SLM devices face the challenge of providing high performance under the influence of different phenomena, such as crosstalk between adjacent pixels, fringing fields, and diffraction effects arising from the finite pixel grid pattern. In this work, a numerical analysis that computes the director orientation as a function of the retardance across specific voltages (gray level) is compared to experimental results. More specifically, this work is focused on analysing how previously mentioned phenomena affect the interpretation of the residual twist angle in parallel-aligned (PA) on SLM. This twist angle is computed from the Stokes parameter and compared to the actual orientation of the director distribution.
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