Dr. Ekua N. Bentil Profile

Dr. Ekua N. Bentil

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Publications (1)

Proceedings Article | 3 February 2009 Paper

Rapid and minimally invasive quantum cascade wafer testing

Ekua Bentil, Fatima Toor, Anthony Hoffman, Matthew Escarra, Claire Gmachl

Proceedings Volume 7230, 72300T (2009) https://doi.org/10.1117/12.810258

KEYWORDS: Semiconducting wafers, Quantum cascade lasers, Wafer testing, Wafer-level optics, Temperature metrology, Laser damage threshold, Electroluminescence, Lithography, Pulsed laser operation, Etching

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