Mr. Edward Coyne Profile

Edward Coyne

at Analog Devices Ireland Ltd

SPIE Involvement:

Author

Publications (8)

SPIE Journal Paper | 1 July 2011

Nanofabrication of superzone solid immersion vortex lens and subwavelength antireflection surfaces for enhanced scanning laser imaging

Edward Coyne

JM3, Vol. 10, Issue 03, 033015, (July 2011) https://doi.org/10.1117/12.10.1117/1.3624517

KEYWORDS: Silicon, Etching, Spiral phase plates, Solids, Antireflective coatings, Diffraction, Wavefronts, Plasma etching, Optical design, Image resolution

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Proceedings Article | 12 April 2005 Paper

Scope for electric field assisted removal of ablated debris from laser machined features in silicon

Edward Coyne, Paul Mannion, Gerard O'Connor, Sebastian Favre, Thomas Glynn

Proceedings Volume 5713, (2005) https://doi.org/10.1117/12.594529

KEYWORDS: Silicon, Semiconductor lasers, Semiconducting wafers, Metals, Femtosecond phenomena, Computer simulations, Electrodes, Laser ablation, Diodes, Particles

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Proceedings Article | 9 December 2004 Paper

Analysis of entrapped debris during femtosecond machining of metals

Paul Mannion, Edward Coyne, Gerard O'Connor, Helen Howard, Thomas Glynn

Proceedings Volume 5578, (2004) https://doi.org/10.1117/12.569284

KEYWORDS: Laser ablation, Pulsed laser operation, Particles, Metals, Laser damage threshold, Femtosecond phenomena, Spherical lenses, Laser processing, Scanning electron microscopy, Ions

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Proceedings Article | 20 September 2004 Paper

The onset of phase explosion and the role of damage accumulation in ultrafast laser processing of common metals in air

Paul Mannion, Gerard O'Connor, Edward Coyne, Helen Howard, Thomas Glynn

Proceedings Volume 5448, (2004) https://doi.org/10.1117/12.547043

KEYWORDS: Laser ablation, Metals, Laser damage threshold, Electrons, Scanning electron microscopy, Particles, Copper, Diffusion, Transition metals, Explosives

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Proceedings Article | 15 July 2004 Paper

Analysis of thermal damage in bulk silicon with femtosecond laser micromachining

Edward Coyne, Gerard O'Connor, Paul Mannion, Jonathan Magee, Thomas Glynn

Proceedings Volume 5339, (2004) https://doi.org/10.1117/12.529218

KEYWORDS: Silicon, Semiconductor lasers, Laser ablation, Femtosecond phenomena, Scanning electron microscopy, Scanning transmission electron microscopy, Wavefronts, Crystals, Laser crystals, Laser damage threshold

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Proceedings Article | 27 August 2003 Paper

Ablation thresholds in ultrafast laser micromachining of common metals in air

Paul Mannion, Jonathan Magee, Edward Coyne, Gerard O'Connor

Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463744

KEYWORDS: Laser ablation, Metals, Pulsed laser operation, Laser damage threshold, Diffusion, Copper, Niobium, Titanium, Femtosecond phenomena, Laser processing

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Proceedings Article | 27 August 2003 Paper

Development and application of an ultrafast laser micromachining workstation

Jonathan Magee, Paul Mannion, Edward Coyne, Gerard O'Connor

Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463756

KEYWORDS: Laser ablation, Femtosecond phenomena, Micromachining, Pulsed laser operation, Polarization, Laser drilling, Laser applications, Electrons, Laser stabilization, Laser damage threshold

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Proceedings Article | 27 August 2003 Paper

Study of femtosecond laser interaction with wafer-grade silicon

Edward Coyne, Jonathan Magee, Paul Mannion, Gerard O'Connor

Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463752

KEYWORDS: Silicon, Pulsed laser operation, Scanning electron microscopy, Semiconductor lasers, Electron microscopes, Diffusion, Laser ablation, Femtosecond phenomena, Thermography, Plasmons

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Showing 5 of 8 publications

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