Dr. Dinh Bao Bui
at Le Quy Don Technical Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Van Ba Nguyen, Ludmila Aleksandrovna Gubanova, Dinh Bao D. Bui
Proceedings Volume 11057, 110571M (2019) https://doi.org/10.1117/12.2525068
KEYWORDS: Refractive index, Thin films, Reflection, Dielectrics, Spectrophotometry, Optical testing

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