Prof. David J. Whitehouse
Emeritus Professor of Engineering Science
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 24 October 2006 Paper
Proceedings Volume 6357, 63571J (2006) https://doi.org/10.1117/12.716966
KEYWORDS: Metrology, Convolution, Manufacturing, Mathematics, Surface roughness, Surface finishing, Inspection, Computing systems, Nomenclature, Eye

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.508362
KEYWORDS: Fractal analysis, Metrology, Manufacturing, Surface finishing, Wavefronts, Calibration, Optical testing, Geometrical optics, Convolution, Nanotechnology

Proceedings Article | 29 July 2002 Paper
Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484633
KEYWORDS: Fractal analysis, Manufacturing, Molecular self-assembly, Metrology, Molecules, Calibration, Mechanics, Nanotechnology, Abrasives, Silver

SPIE Journal Paper | 1 September 1997
OE, Vol. 36, Issue 09, (September 1997) https://doi.org/10.1117/12.10.1117/1.601473
KEYWORDS: Fringe analysis, Phase measurement, Image processing, Computer simulations, Speckle, Phase shifts, Interferometry, Imaging systems, Interferometers, Superposition

SPIE Journal Paper | 1 August 1997
OE, Vol. 36, Issue 08, (August 1997) https://doi.org/10.1117/12.10.1117/1.601442
KEYWORDS: Surface roughness, Image processing, Radium, Nondestructive evaluation, Optical engineering, Microscopes, Statistical analysis, Sensors, Surface finishing, Image restoration

Showing 5 of 7 publications
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