David R. Kiehl
Retired
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Publications (1)

Proceedings Article | 11 March 1994 Paper
Byron Dom, David Steele, Richard Krebs, David Kiehl, Patrick Saldanha, Eric Wong, John Moffitt, Dragutin Petkovic, John Herber, Lionel Kuhlmann, Scott Dunbar
Proceedings Volume 2183, (1994) https://doi.org/10.1117/12.171227
KEYWORDS: Inspection, Sensors, Detection and tracking algorithms, Video, Head, Image analysis, Microscopes, Manufacturing, Edge detection, Defect detection

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