Mr. Christopher Nafis Profile

Christopher Nafis

at GE Research

SPIE Involvement:

Author

Publications (12)

Proceedings Article | 14 May 2015 Paper

Composite layup monitoring using structured light

Robert Tait, Kevin Harding, Chris Nafis

Proceedings Volume 9489, 948908 (2015) https://doi.org/10.1117/12.2177299

KEYWORDS: Composites, Light sources and illumination, Sensors, Cameras, Tolerancing, Head, Neodymium, Glasses, Manufacturing, Structured light

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Proceedings Article | 14 September 2011 Paper

Automated 3D IR defect mapping system for CZT wafer and tile inspection and characterization

Yi Liao, Esmaeil Heidari, Gil Abramovich, Christopher Nafis, Amer Butt, Joseph Czechowski, Kevin Harding, J. Eric Tkaczyk

Proceedings Volume 8133, 81330P (2011) https://doi.org/10.1117/12.892765

KEYWORDS: Semiconducting wafers, Infrared imaging, Inspection, Sensors, Associative arrays, Wafer inspection, 3D image processing, Neodymium, Crystals, Ions

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Proceedings Article | 3 September 2010 Paper

Dual-illumination NIR system for wafer level defect inspection

Yana Williams, Kevin Harding, Gil Abramovich, Christopher Nafis, Eric Tkaczyk, Kristian Andreini, Henry Chen, Glenn Bindley

Proceedings Volume 7793, 77930I (2010) https://doi.org/10.1117/12.861038

KEYWORDS: Semiconducting wafers, Imaging systems, Light sources and illumination, Tellurium, Cameras, Inspection, Manufacturing, Near infrared, Sensors, Light scattering

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Proceedings Article | 3 September 2010 Paper

CZT smart dicing strategy for cost reduction using defect imaging and random-access machining

J. Eric Tkaczyk, Kristian Andreini, Tan Zhang, Kevin Harding, Gil Abramovich, Yana Williams, Christopher Nafis, Wenwu Zhang

Proceedings Volume 7806, 78060L (2010) https://doi.org/10.1117/12.865861

KEYWORDS: Sensors, Semiconducting wafers, Crystals, Image segmentation, Infrared imaging, Inspection, Laser cutting, 3D image processing, Ultrasonography, Image processing

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Proceedings Article | 14 April 2010 Paper

Mobile, contactless, single-shot, fingerprint capture system

Gil Abramovich, Kevin Harding, Swaminathan Manickam, Joseph Czechowski, Vijay Paruchuru, Robert Tait, Christopher Nafis, Arun Vemury

Proceedings Volume 7667, 766708 (2010) https://doi.org/10.1117/12.850708

KEYWORDS: Cameras, Polarization, 3D image processing, Image fusion, Refractive index, Image registration, Liquid crystals, Sensors, Data modeling, 3D modeling

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Proceedings Article | 10 September 2009 Paper

Three-dimensional embedded defect detection and localization in a semi-transparent medium

Gil Abramovich, Christopher Nafis, Yana Williams, Kevin Harding, Eric Tkaczyk

Proceedings Volume 7432, 74321C (2009) https://doi.org/10.1117/12.830444

KEYWORDS: Cameras, Defect detection, Signal to noise ratio, Imaging systems, Sensors, 3D metrology, 3D image processing, Interference (communication), Image analysis, Detection and tracking algorithms

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Proceedings Article | 10 September 2009 Paper

Real-time 3D part metrology using polarization rotation

Gil Abramovich, Kevin Harding, Vijay Paruchuru, Swaminathan Manickam, Christopher Nafis, Joseph Czechowski, Arun Vemury

Proceedings Volume 7432, 743212 (2009) https://doi.org/10.1117/12.828805

KEYWORDS: Lenses, Cameras, Polarization, 3D metrology, 3D image processing, Image quality, Metrology, Calcite, Beam splitters, Imaging systems

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Proceedings Article | 29 August 2008 Paper

Geometric errors in 3D optical metrology systems

Kevin Harding, Chris Nafis

Proceedings Volume 7066, 706603 (2008) https://doi.org/10.1117/12.792552

KEYWORDS: 3D metrology, Error analysis, Optical metrology, Optical spheres, Phase shifts, Metrology, Distortion, Calibration, Cameras, Structured light

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Proceedings Article | 31 March 2008 Paper

Method for evaluating compatibility of commercial electromagnetic (EM) microsensor tracking systems with surgical and imaging tables

Christopher Nafis, Vern Jensen, Ron von Jako

Proceedings Volume 6918, 691820 (2008) https://doi.org/10.1117/12.769513

KEYWORDS: Transmitters, Sensors, Glasses, Surgery, Navigation systems, Electromagnetism, Ruthenium, Imaging systems, Clouds, Manganese

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Proceedings Article | 22 March 2007 Paper

A hardware and software protocol for the evaluation of electromagnetic tracker accuracy in the clinical environment: a multi-center study

Emmanuel Wilson, Ziv Yaniv, Hui Zhang, Christopher Nafis, Eric Shen, Guy Shechter, Andrew Wiles, Terry Peters, David Lindisch, Kevin Cleary

Proceedings Volume 6509, 65092T (2007) https://doi.org/10.1117/12.712701

KEYWORDS: Electromagnetism, Error analysis, Sensors, Distortion, Statistical analysis, Optical tracking, Auroras, Medical research, Metals, Analytical research

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Proceedings Article | 10 March 2006 Paper

Method for estimating dynamic EM tracking accuracy of surgical navigation tools

Christopher Nafis, Vern Jensen, Lee Beauregard, Peter Anderson

Proceedings Volume 6141, 61410K (2006) https://doi.org/10.1117/12.653448

KEYWORDS: Sensors, Transmitters, Receivers, Metals, Distortion, Auroras, Optical tracking, Navigation systems, Gold, Calibration

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Proceedings Article | 21 December 1995 Paper

Augmented reality telemanipulation system for nuclear reactor inspection

Nelson Corby, Chris Nafis

Proceedings Volume 2351, (1995) https://doi.org/10.1117/12.197329

KEYWORDS: Inspection, Video, Cameras, Visualization, Sensors, Augmented reality, Navigation systems, Video acceleration, Control systems, Optical inspection

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Showing 5 of 12 publications

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