Chia-Hung Sun
at Optoelectronic Technology Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 March 2015 Paper
Proceedings Volume 9383, 93831J (2015) https://doi.org/10.1117/12.2079296
KEYWORDS: Light emitting diodes, Patterned sapphire substrate, Indium gallium nitride, External quantum efficiency, Sapphire, Reliability, Resistance, Gallium nitride, Failure analysis, Optoelectronics

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