Chengyin Tsai
at Huazhong University of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 June 2024 Paper
Proceedings Volume 13209, 132090A (2024) https://doi.org/10.1117/12.3025416
KEYWORDS: Diagnostics, Ultrafast phenomena, Simulations, Electron beams, Terahertz radiation, Diffraction, Radiation effects

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