We present preliminary experimental results of X-ray phase-contrast imaging with a tilted-grid to measure the twodimensional phase gradient. The direction of the grid line is rotated 10 degrees relative to the horizontal axis. To obtain the differential phase-contrast image, we employ the spatial harmonic method based on the Fourier transform phase retrieval. The two-dimensional phase gradient of a PMMA sample is well defined in the phase-contrast image acquired with the tilted-grid setup.
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