CONFERENCE PROCEEDINGS
Advanced Search
Brian T. Hart
at L3Harris Technologies Inc
SPIE Involvement:
Author
Publications (1)
SPIE Journal Paper | 1 May 2011
Quantifying wavefront measurement variation with standard deviation maps
OE, Vol. 50, Issue 05, 053607, (May 2011) https://doi.org/10.1117/12.10.1117/1.3577702
KEYWORDS: Wavefronts, Interferometers, Monochromatic aberrations, Optical engineering, Statistical analysis, Computer simulations, Optical spheres, Optical testing, Interferometry, Data acquisition
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top