Prof. Andreas Fischer Profile

Prof. Andreas Fischer

Professor at Universität Bremen

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 15 August 2023 Presentation + Paper

Indirect geometry measurement method based on confocal microscopy and fluorescent microparticles

Andreas Tausendfreund, Björn Espenhahn, Gert Behrends, Andreas Fischer

Proceedings Volume 12618, 126180P (2023) https://doi.org/10.1117/12.2672778

KEYWORDS: Confocal microscopy, Fluorescence, Particles, Fluorescence intensity, Microscopes, Optical surfaces, Aerosols, Liquids, Convolution

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Proceedings Article | 20 June 2021 Presentation + Paper

Speckle pattern modulation for high-resolution displacement measurements

León Schweickhardt, Andreas Tausendfreund, Dirk Stöbener, Andreas Fischer

Proceedings Volume 11782, 117820D (2021) https://doi.org/10.1117/12.2591847

KEYWORDS: Speckle pattern, Spatial resolution, Modulation, Diffusers, Speckle, Digital micromirror devices, Laser marking, Digital image correlation, Materials processing, Manufacturing

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Proceedings Article | 20 June 2021 Presentation + Paper

Speckle photographic in-process measurement of three-dimensional deformations in running manufacturing processes

Andreas Tausendfreund, Dirk Stöbener, Andreas Fischer

Proceedings Volume 11782, 1178205 (2021) https://doi.org/10.1117/12.2592284

KEYWORDS: Speckle, Manufacturing, Photography, 3D metrology, Correlation function, Spectrum analysis, Shape analysis, Motion measurement, Materials processing, Image resolution

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Proceedings Article | 21 June 2019 Presentation + Paper

Model-based confocal fluorescence microscopy measurements of submerged micro geometries

Merlin Mikulewitsch, Axel v. Freyberg, Dirk Stöbener, Andreas Fischer

Proceedings Volume 11057, 110570E (2019) https://doi.org/10.1117/12.2525993

KEYWORDS: Confocal microscopy, Luminescence, Microfluidics, Liquids, Microscopy, Reflectivity, Signal detection, Model-based design, In situ metrology

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Proceedings Article | 26 June 2017 Paper

In-line measuring method for periodical sub-wavelength nanostructures

Gabriela Alexe, Andreas Tausendfreund, Dirk Stöbener, Andreas Fischer

Proceedings Volume 10330, 103300K (2017) https://doi.org/10.1117/12.2270333

KEYWORDS: Optical simulations, Computer simulations, Sensors, Nanostructures, Diffraction gratings, Diffraction, Laser scattering, Light scattering, Process control, Scattering, Calibration, Scatterometry, Device simulation

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Proceedings Article | 26 June 2017 Paper

Uncertainty of scattered light roughness measurements based on speckle correlation methods

Stefan Patzelt, Dirk Stöbener, Gerald Ströbel, Andreas Fischer

Proceedings Volume 10329, 103291P (2017) https://doi.org/10.1117/12.2269171

KEYWORDS: Laser scattering, Statistical analysis, Quantization, Speckle, Light scattering, Optical testing, Cameras, Process modeling, Sensors, Measurement devices, Speckle pattern, Scatter measurement, Metrology

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Showing 5 of 6 publications

Conference Committee Involvement (4)

Optical Measurement Systems for Industrial Inspection XIV

23 June 2025 | Munich, Germany

Optical Measurement Systems for Industrial Inspection XIII

26 June 2023 | Munich, Germany

Optical Measurement Systems for Industrial Inspection XII

21 June 2021 | Online Only, Germany

Optical Measurement Systems for Industrial Inspection XI

24 June 2019 | Munich, Germany

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