The paper considers aspects of an experimental research of the inhomogeneity of the spatial distribution of the absolute sensitivity of multielement photodetectors based on CCD and CMOS structures. The relevance of this research is associated with the need to calibrate optical radiation photodetectors in high-precision instruments to achieve specified measurements, recognition or measurement of parameters of objects of observation. Accuracy distributions on the photosensitive matrix working area are obtained, which make it possible to simplify the geometric distortion correction algorithm, improve the calibration scheme, and reduce the load on the digital processor. In this work, the choice is substantiated and a scheme of the installation is proposed for conducting experimental researches of the spread in the sensitivity of the photodetector at the working site. The results obtained in the course of the research can be used in the calibration of multi-element optical photodetectors to take into account the influence of the uniformity of their sensitivity over the site, in measurements during digital image processing.
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