Amit Janardhan Nimunkar
at Univ of Wisconsin-Madison
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 May 2002 Paper
Amit Nimunkar, Atam Dhawan, Patricia Relue, Sachin Patwardhan
Proceedings Volume 4684, (2002) https://doi.org/10.1117/12.467098
KEYWORDS: Melanoma, Wavelets, Statistical analysis, Electronic filtering, Skin, Wavelet transforms, Image analysis, Skin cancer, Visualization, Analytical research

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