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A. Krishnan
at Broadcom Inc
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Publications (1)
Proceedings Article | 17 June 2003 Paper
Characterization of failure mechanisms for oxide VCSELs
Scott McHugo, A. Krishnan, Joachim Krueger, Yong Luo, Ningxia Tan, Tim Osentowski, Suning Xie, Myrna Mayonte, Robert Herrick, Qing Deng, Mike Heidecker, David Eastley, Mark Keever, Christophe Kocot
Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482637
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical inspection, Failure analysis, Electroluminescence, Reliability, Metals, Contamination, Humidity, Transmission electron microscopy
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