Fringe projection technique has been widely used for three-dimensional (3D) shape measurement. However, it remains challenging to achieve high-speed measurement. A two-wavelength phase-shifting profilometry method with only four patterns is presented. Specifically, all these four patterns contain two wavelength components. The short wavelength component was used to compute the wrapped phase map, while the long one was used to unwrap the wrapped phase map. The performance of the proposed method was validated by both simulation study and experimental results. |
ACCESS THE FULL ARTICLE
No SPIE Account? Create one
![Lens.org Logo](/images/Lens.org/lens-logo.png)
CITATIONS
Cited by 8 scholarly publications.
Phase shifts
3D metrology
Fringe analysis
Cameras
Projection systems
Optical engineering
3D modeling