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10 July 2019 Special Section Guest Editorial: Polarization: Systems, Measurement, Analysis, and Remote Sensing
David B. Chenault, Dennis H. Goldstein, Michael W. Kudenov, Meredith K. Kupinski, Joseph L. Pezzaniti, Joseph A. Shaw, Frans Snik, J. Scott Tyo, Christine L. Bradley
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Optical Engineering, Vol. 58, Issue 8, 082401 (July 2019). https://doi.org/10.1117/1.OE.58.8.082401
Abstract
This guest editorial introduces the Special Section on Polarization: Systems, Measurement, Analysis, and Remote Sensing.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)
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David B. Chenault, Dennis H. Goldstein, Michael W. Kudenov, Meredith K. Kupinski, Joseph L. Pezzaniti, Joseph A. Shaw, Frans Snik, J. Scott Tyo, and Christine L. Bradley "Special Section Guest Editorial: Polarization: Systems, Measurement, Analysis, and Remote Sensing," Optical Engineering 58(8), 082401 (10 July 2019). https://doi.org/10.1117/1.OE.58.8.082401
Published: 10 July 2019
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KEYWORDS
Polarization
Polarimetry
Remote sensing
Optical engineering
Imaging systems
Infrared imaging
Infrared radiation
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