Simulation tools for scattering corrections in spectrally resolved x-ray computed tomography using McXtrace

Matteo Busi; Ulrik L. Olsen; Erik B. Knudsen; Jeppe R. Frisvad; Jan Kehres; Erik S. Dreier; Mohamad Khalil; Kristoffer Haldrup

doi:10.1117/1.OE.57.3.037105

14 March 2018 Simulation tools for scattering corrections in spectrally resolved x-ray computed tomography using McXtrace

Matteo Busi, Ulrik L. Olsen, Erik B. Knudsen, Jeppe R. Frisvad, Jan Kehres, Erik S. Dreier, Mohamad Khalil, Kristoffer Haldrup

Author Affiliations +

Optical Engineering, Vol. 57, Issue 3, 037105 (March 2018). https://doi.org/10.1117/1.OE.57.3.037105

Abstract

Spectral computed tomography is an emerging imaging method that involves using recently developed energy discriminating photon-counting detectors (PCDs). This technique enables measurements at isolated high-energy ranges, in which the dominating undergoing interaction between the x-ray and the sample is the incoherent scattering. The scattered radiation causes a loss of contrast in the results, and its correction has proven to be a complex problem, due to its dependence on energy, material composition, and geometry. Monte Carlo simulations can utilize a physical model to estimate the scattering contribution to the signal, at the cost of high computational time. We present a fast Monte Carlo simulation tool, based on McXtrace, to predict the energy resolved radiation being scattered and absorbed by objects of complex shapes. We validate the tool through measurements using a CdTe single PCD (Multix ME-100) and use it for scattering correction in a simulation of a spectral CT. We found the correction to account for up to 7% relative amplification in the reconstructed linear attenuation. It is a useful tool for x-ray CT to obtain a more accurate material discrimination, especially in the high-energy range, where the incoherent scattering interactions become prevailing (>50 keV).

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Matteo Busi, Ulrik L. Olsen, Erik B. Knudsen, Jeppe R. Frisvad, Jan Kehres, Erik S. Dreier, Mohamad Khalil, and Kristoffer Haldrup "Simulation tools for scattering corrections in spectrally resolved x-ray computed tomography using McXtrace," Optical Engineering 57(3), 037105 (14 March 2018). https://doi.org/10.1117/1.OE.57.3.037105

Received: 25 October 2017; Accepted: 14 February 2018; Published: 14 March 2018

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