23 July 2015 Decoding line structured light patterns by using Fourier analysis
Yunfei Long, Shuaijun Wang, Wei Wu, Xiaomin Yang, Gwanggil Jeon, Kai Liu
Author Affiliations +
Abstract
Line structured light techniques, especially laser scanning, are preferred for commercialized three-dimensional (3-D) shape acquisition. Typically, a captured line stripe is to be detected spatially within a single image, and the detection may fail if there are ambiguities in the image. We present a decoding strategy for line structured light patterns. Over all recorded line-patterned images, by means of Fourier analysis along the time axis for each pixel, a phase map is computed and employed for 3-D reconstruction. The phase error is theoretically analyzed. Experimental results demonstrate that, compared with typical approaches based on spatial stripe peak detection, the proposed method achieves comparable accuracy and, most importantly, successfully handles the issue of ambiguities.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286 /2015/$25.00 © 2015 SPIE
Yunfei Long, Shuaijun Wang, Wei Wu, Xiaomin Yang, Gwanggil Jeon, and Kai Liu "Decoding line structured light patterns by using Fourier analysis," Optical Engineering 54(7), 073109 (23 July 2015). https://doi.org/10.1117/1.OE.54.7.073109
Published: 23 July 2015
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Structured light

Projection systems

Cameras

3D image processing

Error analysis

3D acquisition

3D image reconstruction

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