4 February 2015 Development of in-plane and out-of-plane deformations simultaneous measurement method for the analysis of buckling
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Abstract
In the measurement of deformation of buckling phenomenon, the optical measurement methods have been traditionally employed for performing noncontact measurement. Furthermore, because the in-plane and out-of-plane deformations simultaneously happen in the buckling phenomena, these in-plane and out-of-plane deformations must be separated precisely by analyzing some measured results of dynamic events. In traditional methods, some two-beam interferometers have been combined to measure in-plane and out-of-plane deformations as three-dimensional deformations. An ordinary two-beam interferometer is defined as the optical system that is combined by two independent interferometers. Under this definition, a new interferometer that is set up by two cameras and one laser is constructed by using the idea of a speckle interferometer that uses only two speckle patterns. Then, an analysis method for separation of in-plane and out-of-plane deformations is also proposed. In the experimental results, the high measuring accuracy of the proposed methods is confirmed. Consequently, the independency between in-plane and out-of-plane measurements in this method is confirmed. Furthermore, the new method is applied to the analysis of the buckling phenomenon. As the results, it can be confirmed that the results of the beam of buckling analysis agree very well with the theory of Euler’s buckling.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2015/$25.00 © 2015 SPIE
Yasuhiko Arai "Development of in-plane and out-of-plane deformations simultaneous measurement method for the analysis of buckling," Optical Engineering 54(2), 024102 (4 February 2015). https://doi.org/10.1117/1.OE.54.2.024102
Published: 4 February 2015
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Cited by 21 scholarly publications.
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KEYWORDS
Cameras

Speckle pattern

Interferometers

Ferroelectric materials

Fringe analysis

Optical engineering

Optical testing

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