Optical three-dimensional metrology with structured illumination

Rainer Tutsch; Marcus Petz; Marc Fischer

doi:10.1117/1.3578448

1 October 2011 Optical three-dimensional metrology with structured illumination

Rainer Tutsch, Marcus Petz, Marc Fischer

Author Affiliations +

Optical Engineering, Vol. 50, Issue 10, 101507 (October 2011). https://doi.org/10.1117/1.3578448

Abstract

A variety of techniques have been developed to measure the three-dimensional shape of an object using structured illumination. The measurement of objects with diffusely reflecting surfaces by means of projected patterns can be considered a standard technique. Also more recently, methods for the measurement of specularly reflecting or transparent surfaces by evaluation of the images of regular patterns have been published. In this paper, we suggest a systematic treatment of all of these methods as generalized active or passive triangulation techniques.

©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Rainer Tutsch, Marcus Petz, and Marc Fischer "Optical three-dimensional metrology with structured illumination," Optical Engineering 50(10), 101507 (1 October 2011). https://doi.org/10.1117/1.3578448

Published: 1 October 2011

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