New image quality assessment method using wavelet leader pyramids

Xiaolin Chen; Xiaokang Yang; Shibao Zheng; Weiyao Lin; Rui Zhang; Guangtao Zhai

doi:10.1117/1.3591949

1 June 2011 New image quality assessment method using wavelet leader pyramids

Xiaolin Chen, Xiaokang Yang, Shibao Zheng, Weiyao Lin, Rui Zhang, Guangtao Zhai

Author Affiliations +

Optical Engineering, Vol. 50, Issue 6, 067011 (June 2011). https://doi.org/10.1117/1.3591949

Abstract

In this paper, we propose a wave leader pyramids based Visual Information Fidelity method for image quality assessment. Motivated by the observations that the human vision systems (HVS) are more sensitive to edge and contour regions and that the human visual sensitivity varies with spatial frequency, we first introduce the two-dimensional wavelet leader pyramids to robustly extract the multiscale information of edges. Based on the wavelet leader pyramids, we further propose a visual information fidelity metric to evaluate the quality of images by quantifying the information loss between the original and the distorted images. Experimental results show that our method outperforms many state-of-the-art image quality metrics.

©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Xiaolin Chen, Xiaokang Yang, Shibao Zheng, Weiyao Lin, Rui Zhang, and Guangtao Zhai "New image quality assessment method using wavelet leader pyramids," Optical Engineering 50(6), 067011 (1 June 2011). https://doi.org/10.1117/1.3591949

Published: 1 June 2011

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