Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz; James Carriere; Raymond K. Kostuk

doi:10.1117/1.1814364

1 December 2004 Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz, James Carriere, Raymond K. Kostuk

Author Affiliations +

Optical Engineering, Vol. 43, Issue 12, (December 2004). https://doi.org/10.1117/1.1814364

Abstract

We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag⁺/Na⁺ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 µm.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Jesse A. Frantz, James Carriere, and Raymond K. Kostuk "Measurement of ion-exchanged waveguide burial depth with a camera," Optical Engineering 43(12), (1 December 2004). https://doi.org/10.1117/1.1814364

Published: 1 December 2004

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