Beam-selector dependent on incident angle by guided-mode resonant subwavelength grating

Ya Nie; Lei Wang; Zhiheng Wang; Chengjun Lai

doi:10.1117/1.1511531

1 November 2002 Beam-selector dependent on incident angle by guided-mode resonant subwavelength grating

Ya Nie, Lei Wang, Zhiheng Wang, Chengjun Lai

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Optical Engineering, Vol. 41, Issue 11, (November 2002). https://doi.org/10.1117/1.1511531

Guided-mode resonances in subwavelength gratings are strongly dependent on incident angles. A beam selector with high sensitivity is designed based on this property. A guided-mode resonant silicon nitride (Si₃N₄) grating on a silicon dioxide (SiO₂) substrate is presented as an example of such a device with a 1.55 μm wavelength. The calculated reflection resonance has an incident angle FWHM of Δθ~0.0042 radians, and a normal-incident peak efficiency of ~99.9%. In addition, we propose that this type of beam selector be applied to select transverse modes of semiconductor lasers.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Ya Nie, Lei Wang, Zhiheng Wang, and Chengjun Lai "Beam-selector dependent on incident angle by guided-mode resonant subwavelength grating," Optical Engineering 41(11), (1 November 2002). https://doi.org/10.1117/1.1511531

Published: 1 November 2002

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