1 January 2002 New wavelet transforms for noise insensitive edge detection
Author Affiliations +
Two new wavelet transforms for noise-insensitive edge detection are analyzed and discussed. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.
©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Feijun Song and Suganda Jutamulia "New wavelet transforms for noise insensitive edge detection," Optical Engineering 41(1), (1 January 2002). https://doi.org/10.1117/1.1424877
Published: 1 January 2002
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavelet transforms

Edge detection

Wavelets

Lead

Inspection

Collimation

Bandpass filters

RELATED CONTENT

Wavelet signal processing applied to laser beam diagnostics
Proceedings of SPIE (October 26 1999)
Wavelet transform and its use in edge detection
Proceedings of SPIE (October 03 2000)
Fast frequency estimation using spline wavelets
Proceedings of SPIE (September 17 2005)
Computer vision and wavelet transforms
Proceedings of SPIE (April 03 1997)
Three-dimensional CT data processing for inspection
Proceedings of SPIE (January 28 1999)

Back to Top