Phase unwrapping algorithm based on reliability and edge detection

Jie-Lin Li; Xianyu Su; Ji-Tao Li

doi:10.1117/1.601194

1 June 1997 Phase unwrapping algorithm based on reliability and edge detection

Jie-Lin Li, Xianyu Su, Ji-Tao Li

Optical Engineering, Vol. 36, Issue 6, (June 1997). https://doi.org/10.1117/1.601194

A new phase unwrapping algorithm based on reliability and edge detection is presented. Since the edge is detected efficiently through edge relaxation, the unwrapping procedure is simplified within the areas embraced by edges. Penetrating edges according to reliability ensures that this method will limit the unwrapping error to local-minimum areas at worst.

Citation Download Citation

Jie-Lin Li, Xianyu Su, and Ji-Tao Li "Phase unwrapping algorithm based on reliability and edge detection," Optical Engineering 36(6), (1 June 1997). https://doi.org/10.1117/1.601194

Published: 1 June 1997

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available