1 August 1996 Reduced alignment accuracy requirement using focused Gaussian beams for free-space optical interconnection
Hironori Sasaki, Keisuke Shinozaki, Takeshi Kamijoh
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The use of a focused Gaussian beam in the space variant micro-optical interconnection system is proposed for decreasing the alignment accuracy requirement. The relationship between both longitudinal and lateral misalignment of the light source and the power loss due to beam shift and beam spot size mismatch at the collimating lens and the photodetector are derived theoretically using ABCD matrices, and numerical simulation results are also given. A focused Gaussian microoptical system is introduced by changing the beam radius ratio on the two lenses of the one-to-one Gaussian micro-optical system from unity. It is shown that the focused Gaussian micro-optical system with a smaller beam radius on the second collimating lens than on the first one has improved misalignment tolerances compared with the one-to-one Gaussian micro-optical system.
Hironori Sasaki, Keisuke Shinozaki, and Takeshi Kamijoh "Reduced alignment accuracy requirement using focused Gaussian beams for free-space optical interconnection," Optical Engineering 35(8), (1 August 1996). https://doi.org/10.1117/1.600799
Published: 1 August 1996
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Cited by 7 scholarly publications and 1 patent.
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KEYWORDS
Light sources

Photodetectors

Optical interconnects

Microlens

Tolerancing

Optical alignment

Gaussian beams

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