Scanner performance from edge slope and cutoff frequencies [also Erratum 36(8)2361(Aug1997)]

James J. Jakubowski

doi:10.1117/1.600776

1 July 1996 Scanner performance from edge slope and cutoff frequencies [also Erratum 36(8)2361(Aug1997)]

James J. Jakubowski

Author Affiliations +

Optical Engineering, Vol. 35, Issue 7, (July 1996). https://doi.org/10.1117/1.600776

The day-to-day evaluation of a scanner system’s performance, a problem in quality assurance, is addressed by deriving a technique for establishing it’s system cutoff spatial frequency through the analysis of the edge slope. It is shown that the slope value at the midpoint of the system’s imaged edge (edge response) is related (and, for some conditions, equal to) its cutoff frequency. From the analysis, a parameter emerges that describes the sampling aperture as ‘‘hard’’ or ‘‘soft,’’ signifying whether its shape is best described by geometrical or physical optics, respectively. The physical implications of this description are discussed and results are substantiated experimentally using a microdensitometer.

Citation Download Citation

James J. Jakubowski "Scanner performance from edge slope and cutoff frequencies [also Erratum 36(8)2361(Aug1997)]," Optical Engineering 35(7), (1 July 1996). https://doi.org/10.1117/1.600776

Published: 1 July 1996

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $24.00

Non-members: $28.00 ADD TO CART

JOURNAL ERRATUM
12 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Scanners

Sensors

Modulation transfer functions

Optical engineering

Geometrical optics

Imaging systems

Silicon

Show All Keywords

Keywords/Phrases

Search In:

Publication Years