Equal-thickness-fringe multiple reflection interferometer for ultra-high-speed interference recording

Jian Lu; Xiao-Wu Ni; Anzhi He

doi:10.1117/1.600611

1 June 1996 Equal-thickness-fringe multiple reflection interferometer for ultra-high-speed interference recording

Jian Lu, Xiao-Wu Ni, Anzhi He

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Optical Engineering, Vol. 35, Issue 6, (June 1996). https://doi.org/10.1117/1.600611

An equal-thickness-fringe multiple reflection interferometer for ultra-high-speed multiframe recording is reported. The initial process of laser-produced plasma on a dielectric film layer is explored using this interferometer, and five interferograms with 30-ns frame intervals are obtained.

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Jian Lu, Xiao-Wu Ni, and Anzhi He "Equal-thickness-fringe multiple reflection interferometer for ultra-high-speed interference recording," Optical Engineering 35(6), (1 June 1996). https://doi.org/10.1117/1.600611

Published: 1 June 1996

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