Scanned-fringe, spatial-harmonic-distortion test for detector nonlinearity

Alberto J. Varela; Glenn D. Boreman

doi:10.1117/12.159335

1 March 1994 Scanned-fringe, spatial-harmonic-distortion test for detector nonlinearity

Alberto J. Varela, Glenn D. Boreman

Author Affiliations +

Optical Engineering, Vol. 33, Issue 3, (March 1994). https://doi.org/10.1117/12.159335

Abstract

Results are presented for a modification of the spatial-harmonic-distortion test, suitable for nonlinearity measurement of single-element detectors, using a scanned-fringe technique and an electronic spectrum analyzer. Detector nonlinearity of less than 1% was measured at a wavelength of 10.6 μm. Previously, the smallest measured nonlinearity for the spatial-harmonic-distortion test was of the order of 3%, using a stationary-fringe technique and an 8-bit frame grabber.

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Alberto J. Varela and Glenn D. Boreman "Scanned-fringe, spatial-harmonic-distortion test for detector nonlinearity," Optical Engineering 33(3), (1 March 1994). https://doi.org/10.1117/12.159335

Published: 1 March 1994

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